Chalker, PR, Taylor, S, Mitrovic, I, Mu, Y, Yanfei, Q, Zhao, C, Sang, L, Qifeng, L and Yutao, C
(2016)
Real-time and on-site γ-ray radiation response testing system for semiconductor devices and its applications.
Nuclear Instruments and Methods in Physics Research B.
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Item Type: | Article |
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Depositing User: | Symplectic Admin |
Date Deposited: | 08 Apr 2016 10:12 |
Last Modified: | 30 Aug 2017 13:42 |
DOI: | 10.1016/j.nimb.2016.01.035 |
URI: | http://livrepository.liverpool.ac.uk/id/eprint/3000341 |
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