Real-time and on-site γ-ray radiation response testing system for semiconductor devices and its applications



Chalker, PR, Taylor, S, Mitrovic, I, Mu, Y, Yanfei, Q, Zhao, C, Sang, L, Qifeng, L and Yutao, C
(2016) Real-time and on-site γ-ray radiation response testing system for semiconductor devices and its applications. Nuclear Instruments and Methods in Physics Research B.

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Item Type: Article
Depositing User: Symplectic Admin
Date Deposited: 08 Apr 2016 10:12
Last Modified: 30 Aug 2017 13:42
DOI: 10.1016/j.nimb.2016.01.035
URI: http://livrepository.liverpool.ac.uk/id/eprint/3000341

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