Shaw, A, Jin, JD, Mitrovic, IZ, Wrench, JS, Chalker, PR and Hall, S
(2000)
Extraction of the sub-band gap density of states of Nb doped ZnO thin film transistors using C-V measurements.
Microelectronic Engineering.
ISSN 0167-9317
(Submitted)
There is a more recent version of this item available. |
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Shaw et al MEE 2017.pdf - Author Accepted Manuscript Access to this file is embargoed until Unspecified. Download (469kB) |
Item Type: | Article |
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Depositing User: | Symplectic Admin |
Date Deposited: | 27 Apr 2017 06:20 |
Last Modified: | 19 Jan 2023 07:05 |
URI: | https://livrepository.liverpool.ac.uk/id/eprint/3007148 |
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