Fan-in analysis of a leaky integrator circuit using charge transfer synapses



Dowrick, Thomas, McDaid, Liam and Hall, Stephen ORCID: 0000-0001-8387-1036
(2018) Fan-in analysis of a leaky integrator circuit using charge transfer synapses. NEUROCOMPUTING, 314. 78 - 85.

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Item Type: Article
Uncontrolled Keywords: Neuromorphic circuits, Fan-in, Spiking neural network, Leaky integrator, Charge transfer synapse, CMOS
Depositing User: Symplectic Admin
Date Deposited: 29 Jun 2018 09:15
Last Modified: 19 Jan 2023 01:31
DOI: 10.1016/j.neucom.2018.06.065
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URI: https://livrepository.liverpool.ac.uk/id/eprint/3023152

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