Khursheed, S and Rossi, Daniele
(2019)
Detection of Recycled ICs via On-Chip Leakage Current Sensors.
In: 4th International Verification and Security Workshop (IVSW), 2019-7-1 - 2019-7-3, Rhodes Island, Greece.
Text
IVSW_2019_paper_12.pdf - Author Accepted Manuscript Access to this file is restricted: awaiting official publication and publisher embargo. Download (558kB) |
Item Type: | Conference or Workshop Item (Unspecified) |
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Depositing User: | Symplectic Admin |
Date Deposited: | 04 Jul 2019 15:23 |
Last Modified: | 19 Jan 2023 00:38 |
URI: | https://livrepository.liverpool.ac.uk/id/eprint/3048623 |
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