Suppression of Surface Leakage Currents in InAs Avalanche Photodiodes via Sputtering of High-k Dielectric Layers

Cao, Zhongming, Mitrovic, Ivona Z ORCID: 0000-0003-4816-8905 and Sandall, Ian (2020) Suppression of Surface Leakage Currents in InAs Avalanche Photodiodes via Sputtering of High-k Dielectric Layers. IEEE Transactions on Electron Devices.

Text Cao et al-IEEE TED-2020-accepted manuscript.pdf - Author Accepted Manuscript Access to this file is restricted: awaiting official publication and publisher embargo. Download (1MB)

Item Type:	Article
Depositing User:	Symplectic Admin
Date Deposited:	04 Aug 2020 08:46
Last Modified:	18 Jan 2023 23:38
DOI:	10.1109/TED.2020.3012122
URI:	https://livrepository.liverpool.ac.uk/id/eprint/3096247

Available Versions of this Item

• Suppression of Surface Leakage Currents in InAs Avalanche Photodiodes via Sputtering of High-k Dielectric Layers. (deposited 04 Aug 2020 08:46) [Currently Displayed]
  • Suppression of Surface Leakage Currents in InAs Avalanche Photodiodes via Sputtering of High-k Dielectric Layers. (deposited 04 Aug 2020 09:34)