Multiple Open-Circuit Fault Detection and Isolation Using Universal Low-Cost Diagnosis Circuits for Reconfigurable Dual-Active-Bridge Converters



Khan, Shahamat Shahzad, Wen, Huiqing, Shi, Haochen, Hu, Yihua ORCID: 0000-0002-1007-1617, Jiang, Lin ORCID: 0000-0001-6531-2791 and Chen, Guipeng
(2023) Multiple Open-Circuit Fault Detection and Isolation Using Universal Low-Cost Diagnosis Circuits for Reconfigurable Dual-Active-Bridge Converters. IEEE TRANSACTIONS ON POWER ELECTRONICS, 38 (5). pp. 6504-6521.

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Abstract

Compared with single-switch open-circuit faults (SOCFs), multiple switches open-circuit faults (MOCFs) of power electronic devices (PEDs) due to high voltage or current stress, false triggering, and manufacturing tolerance have become more challenging. To address this issue, a reconfigurable dual-active-bridge (R-DAB) converter is presented with a fast, accurate, robust, and low-cost fault detection (FD) and fault isolation (FI) scheme to accommodate both SOCFs and MOCFs. Compared with the standard DAB topology, the proposed R-DAB will utilize a center-tapped high-frequency transformer and two symmetrical auxiliary inductors, where inherent half-bridge conduction branches are capable of maintaining uninterrupted operations. The proposed FD and FI scheme is straightforward and universal since only the center-tap current in the primary and secondary bridge is monitored as the universal fault signature. Moreover, a simple and low-cost fault diagnostic circuit was designed, which can detect and isolate various open circuit faults (OCFs) of PEDs under varying input and output conditions, without using expensive voltage and current sensors. This sensorless fault diagnosis technique can achieve the fastest FD and isolation speed reported so far, which is within a couple of μ s for various OCFs. Experimental results were acquired from an R-DAB prototype under various OCFs to validate the effectiveness of the proposed technique.

Item Type: Article
Additional Information: (c) 2023 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works.
Uncontrolled Keywords: Circuit faults, Bridge circuits, Voltage measurement, Inductors, Sensors, Reliability, Fault detection, Fault detection (FD), fault isolation (FI), multiple switches open-circuit faults (MOCFs), reconfigurable dual active bridge converters (R-DAB)
Divisions: Faculty of Science and Engineering > School of Electrical Engineering, Electronics and Computer Science
Depositing User: Symplectic Admin
Date Deposited: 08 Feb 2023 09:54
Last Modified: 15 Mar 2024 04:51
DOI: 10.1109/TPEL.2023.3234592
Related URLs:
URI: https://livrepository.liverpool.ac.uk/id/eprint/3168261