Core hole electron screening in InSb

Alsawi, A, Sait, CRJ, Hesp, D, Unsworth, P, Ashwin, MJ ORCID: 0000-0001-8657-8097, Dhanak, VR ORCID: 0000-0001-8053-654X, Veal, TD ORCID: 0000-0002-0610-5626 and Weightman, P (2023) Core hole electron screening in InSb. Journal of Electron Spectroscopy and Related Phenomena, 269. p. 147402.

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Official URL: http://dx.doi.org/10.1016/j.elspec.2023.147402

Abstract

The application of a potential model to the analysis of differences between the Auger parameters of InSb and the elemental materials yields a value 1.82±0.07Å for the core hole screening distance in InSb. It also yields a value of 0.22 ± 0.49 e for the charge transfer in InSb. Shifts in the Auger parameters of elements between their metallic states and in a compound semiconductor are interpreted using a novel method based on quantifying atomic core potential, as a quantum mechanical observable, in terms of its dependence on the valence charge and the number of atomic core holes. The core hole screening distance is ∼30% larger than half the interatomic distance between the nearest neighbors and, by the equivalent cores model, is expected to be the screening radius of Sn and Te impurities in InSb.

Item Type:	Article
Divisions:	Faculty of Science and Engineering > School of Physical Sciences
Depositing User:	Symplectic Admin
Date Deposited:	20 Nov 2023 09:54
Last Modified:	20 Nov 2023 21:28
DOI:	10.1016/j.elspec.2023.147402
Open Access URL:	https://doi.org/10.1016/j.elspec.2023.147402
Related URLs:	Publisher
URI:	https://livrepository.liverpool.ac.uk/id/eprint/3176864