Jin, J, Zhang, J, Kemal, RE, Luo, Y, Bao, P, Althobaiti, M, Hesp, D, Dhanak, VR, Zheng, Z, Mitrovic, IZ et al (show 2 more authors)
(2016)
Effects of annealing conditions on resistive switching characteristics of SnOx thin films.
JOURNAL OF ALLOYS AND COMPOUNDS, 673.
54 - 59.
ISSN 0925-8388
There is a more recent version of this item available. |
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JAC manuscript Jin et al.docx - Author Accepted Manuscript Download (16MB) |
Item Type: | Article |
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Uncontrolled Keywords: | Tin compounds, Resistive switching, Annealing |
Depositing User: | Symplectic Admin |
Date Deposited: | 26 Apr 2016 15:56 |
Last Modified: | 19 Jan 2023 07:37 |
DOI: | 10.1016/j.jallcom.2016.02.215 |
Related URLs: | |
URI: | https://livrepository.liverpool.ac.uk/id/eprint/3000632 |
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- Effects of annealing conditions on resistive switching characteristics of SnOx thin films. (deposited 26 Apr 2016 15:56) [Currently Displayed]
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