Effects of annealing conditions on resistive switching characteristics of SnOx thin films



Jin, J, Zhang, J, Kemal, RE, Luo, Y, Bao, P, Althobaiti, M, Hesp, D, Dhanak, VR, Zheng, Z, Mitrovic, IZ
et al (show 2 more authors) (2016) Effects of annealing conditions on resistive switching characteristics of SnOx thin films. JOURNAL OF ALLOYS AND COMPOUNDS, 673. 54 - 59. ISSN 0925-8388

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Item Type: Article
Uncontrolled Keywords: Tin compounds, Resistive switching, Annealing
Depositing User: Symplectic Admin
Date Deposited: 26 Apr 2016 15:56
Last Modified: 19 Jan 2023 07:37
DOI: 10.1016/j.jallcom.2016.02.215
Related URLs:
URI: https://livrepository.liverpool.ac.uk/id/eprint/3000632

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