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Number of items: 2.
Narang, Anuraag 
ORCID: 0000-0001-8033-1261, Venu, Balaji, Khursheed, Syed-Saqib and Harrod, Peter
(2021)
An Exploration of Microprocessor Self-Test Optimisation Based On Safe Faults.
In: 34th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2021-10-6 - 2021-10-8.
Narwariya, Anmol Singh, Das, Pabitra, Khursheed, Saqib and Acharyya, Amit
(2022)
Operational Age Estimation of ICs using Gaussian Process Regression.
In: 2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2022-10-19 - 2022-10-21, Austin, TX, USA.