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Shen, ZJ, Zhao, C, Zhao, CZ, Mitrovic, IZ ORCID: 0000-0003-4816-8905, Yang, L, Xu, WY, Lim, EG ORCID: 0000-0003-0199-7386, Luo, T and Huang, YB (2019) Al/GO/Si/Al RRAM with Solution-processed GO dielectric at Low Fabrication Temperature. In: 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), 2019-4-1 - 2019-4-3, Grenoble, France.


Zhao, TS, Zhao, C, Zhao, CZ, Xu, WY, Yang, L, Mitrovic, IZ ORCID: 0000-0003-4816-8905, Hall, S ORCID: 0000-0001-8387-1036, Lim, EG ORCID: 0000-0003-0199-7386 and Yu, SC (2019) Eco-Friendly, Low-temperature Solution-processed InO/AlO Thin-film Transistor with Li-incorporation. In: 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), 2019-4-1 - 2019-4-3, Grenoble, France.


Liu, Y ORCID: 0000-0003-0437-7289, Zhu, X ORCID: 0000-0002-7371-4595, Lim, EG ORCID: 0000-0003-0199-7386, Jiang, Y and Huang, Y ORCID: 0000-0001-7774-1024 (2019) Fast Iterative Semi-Blind Receiver for URLLC in Short-Frame Full-Duplex Systems with CFO. IEEE Journal on Selected Areas in Communications, 37 (4). pp. 839-853.


Liu, QH, Zhao, C, Zhao, CZ, Mitrovic, IZ ORCID: 0000-0003-4816-8905, Hall, S ORCID: 0000-0001-8387-1036, Xu, WY, Yang, L, Lim, EG ORCID: 0000-0003-0199-7386, Wang, QN, Wei, YL et al (show 1 more authors) (2019) Fully Solution-Processed Sodium Doped ZnO Thin-Film Transistors via a Low-Temperature Aqueous Route. In: 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), 2019-4-1 - 2019-4-3, Grenoble, France.


Wang, J, Leach, M, Lim, EG ORCID: 0000-0003-0199-7386, Wang, Z and Huang, Y ORCID: 0000-0001-7774-1024 (2019) Investigation of magnetic resonance coupling circuit topologies for wireless power transmission. Microwave and Optical Technology Letters, 61 (7). pp. 1755-1763.


Qi, YF, Shen, ZJ, Zhao, Chun, Mitrovic, IZ ORCID: 0000-0003-4816-8905, Xu, WY, Lim, EG ORCID: 0000-0003-0199-7386, Yang, L, He, JH, Luo, T, Huang, YB et al (show 1 more authors) (2020) Resistive switching behavior of solution-processed AlO<sub>x</sub> and GO based RRAM at low temperature. SOLID-STATE ELECTRONICS, 168. p. 107735.

This list was generated on Sun Apr 21 12:41:42 2024 BST.