Online Fault Tolerance Technique for TSV-Based 3-D-IC

Zhao, Y, Khursheed, S and Al-Hashimi, BM
(2015) Online Fault Tolerance Technique for TSV-Based 3-D-IC. IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 23 (8). 1567 - 1571. ISSN 1063-8210

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Item Type: Article
Uncontrolled Keywords: 3-D, delay test, fault tolerance, online test, through-silicon-vias (TSV)
Depositing User: Symplectic Admin
Date Deposited: 07 Sep 2015 09:04
Last Modified: 31 Oct 2018 10:28
DOI: 10.1109/TVLSI.2014.2343156

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