Delay Test for Diagnosis of Power Switches



Khursheed, Saqib, Shi, Kan, Al-Hashimi, Bashir M, Wilson, Peter R and Chakrabarty, Krishnendu
(2014) Delay Test for Diagnosis of Power Switches. IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 22 (2). 197 - 206.

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Item Type: Article
Uncontrolled Keywords: Design for test (DFT), diagnosis, leakage power management, power gating, sleep transistor
Depositing User: Symplectic Admin
Date Deposited: 07 Sep 2015 08:53
Last Modified: 16 Sep 2021 15:10
DOI: 10.1109/TVLSI.2013.2239319
Related URLs:
URI: https://livrepository.liverpool.ac.uk/id/eprint/2024264