Reliable State Retention-Based Embedded Processors Through Monitoring and Recovery



Yang, Sheng, Khursheed, Saqib, Al-Hashimi, Bashir M, Flynn, David and Idgunji, Sachin
(2011) Reliable State Retention-Based Embedded Processors Through Monitoring and Recovery. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 30 (12). 1773 - 1785.

[img] Text
06071090.pdf
Access to this file is embargoed until Unspecified.

Download (866kB)
Item Type: Article
Uncontrolled Keywords: Error correction, power gating, reliability, state retention, voltage scaling, voltage-scaled state retention
Depositing User: Symplectic Admin
Date Deposited: 07 Sep 2015 08:52
Last Modified: 09 Jan 2021 08:42
DOI: 10.1109/TCAD.2011.2166590
Related URLs:
URI: https://livrepository.liverpool.ac.uk/id/eprint/2024265