Process Variation-Aware Test for Resistive Bridges

Ingelsson, Urban, Al-Hashimi, Bashir M, Khursheed, Saqib, Reddy, Sudhakar M and Harrod, Peter
(2009) Process Variation-Aware Test for Resistive Bridges. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 28 (8). pp. 1269-1274.

[img] Text
05166639.pdf - Unspecified
Access to this file is embargoed until Unspecified.

Download (471kB)


This paper analyzes the behavior of resistive bridging faults under process variation and shows that process variation has a detrimental impact on test quality in the form of test escapes. To quantify this impact, a novel metric called test robustness is proposed and to mitigate test escapes, a new process variation-aware test generation method is presented. The method exploits the observation that logic faults that have high probability of occurrence and correspond to significant amounts of undetected bridge resistance have a high impact on test robustness and therefore should be targeted by test generation. Using synthesized International Symposium on Circuits and Systems benchmarks with realistic bridge locations, results show that for all the benchmarks, the method achieves better results (less test escapes) than tests generated without consideration of process variation. © 2009 IEEE.

Item Type: Article
Uncontrolled Keywords: Automatic test pattern generation (ATPG), process variation, resistive bridges
Depositing User: Symplectic Admin
Date Deposited: 07 Sep 2015 08:48
Last Modified: 16 Dec 2022 02:27
DOI: 10.1109/TCAD.2009.2021728
Related URLs: