Process Variation-Aware Test for Resistive Bridges



Ingelsson, Urban, Al-Hashimi, Bashir M, Khursheed, Saqib, Reddy, Sudhakar M and Harrod, Peter
(2009) Process Variation-Aware Test for Resistive Bridges. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 28 (8). 1269 - 1274.

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Item Type: Article
Uncontrolled Keywords: Automatic test pattern generation (ATPG), process variation, resistive bridges
Depositing User: Symplectic Admin
Date Deposited: 07 Sep 2015 08:48
Last Modified: 16 Oct 2021 21:10
DOI: 10.1109/TCAD.2009.2021728
Related URLs:
URI: https://livrepository.liverpool.ac.uk/id/eprint/2024268