Efficient static compaction techniques for sequential circuits based on reverse-order restoration and test relaxation



El-Maleh, Aiman H, Khursheed, S Saqib and Sait, Sadiq M
(2006) Efficient static compaction techniques for sequential circuits based on reverse-order restoration and test relaxation. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 25 (11). 2556 - 2564.

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Item Type: Article
Uncontrolled Keywords: fault coverage, linear reverse-order restoration (LROR), state traversal (ST), static compaction, test relaxation
Depositing User: Symplectic Admin
Date Deposited: 07 Sep 2015 08:25
Last Modified: 16 Sep 2021 15:10
DOI: 10.1109/TCAD.2006.873895
Related URLs:
URI: https://livrepository.liverpool.ac.uk/id/eprint/2024271