Online Fault Tolerance Technique for TSV-Based 3-D-IC



Zhao, Yi, Khursheed, Saqib and Al-Hashimi, Bashir M
(2015) Online Fault Tolerance Technique for TSV-Based 3-D-IC. IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 23 (8). 1567 - 1571.

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Item Type: Article
Uncontrolled Keywords: 3-D, delay test, fault tolerance, online test, through-silicon-vias (TSV)
Depositing User: Symplectic Admin
Date Deposited: 28 Apr 2016 08:25
Last Modified: 16 Sep 2021 15:10
DOI: 10.1109/TVLSI.2014.2343156
Related URLs:
URI: https://livrepository.liverpool.ac.uk/id/eprint/3000952

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