Khursheed, S
ORCID: 0000-0002-5720-0607, Vivet, P, Hopsch, F and Marinissen, EJ
(2016)
Guest Editors' Introduction: Robust 3-D Stacked ICs
IEEE Design and Test, 33 (3).
pp. 6-7.
ISSN 2168-2356, 2168-2364
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Text
DnT.pdf - Unspecified Download (153kB) |
Official URL: https://doi.org/10.1109/mdat.2016.2542210
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | 40 Engineering, 4009 Electronics, Sensors and Digital Hardware |
| Depositing User: | Symplectic Admin |
| Date Deposited: | 09 May 2016 10:01 |
| Last Modified: | 24 Jan 2026 00:44 |
| DOI: | 10.1109/MDAT.2016.2542210 |
| Related Websites: | |
| URI: | https://livrepository.liverpool.ac.uk/id/eprint/3001130 |
| Disclaimer: | The University of Liverpool is not responsible for content contained on other websites from links within repository metadata. Please contact us if you notice anything that appears incorrect or inappropriate. |
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