Effects of annealing conditions on resistive switching characteristics of SnOx thin films



Jin, Jidong, Zhang, Jiawei, Kemal, Remzi E, Luo, Yi, Bao, Peng, Althobaiti, Mohammed, Hesp, David, Dhanak, Vinod R, Zheng, Zhaoliang ORCID: 0000-0001-6741-6148, Mitrovic, Ivona Z ORCID: 0000-0003-4816-8905
et al (show 2 more authors) (2016) Effects of annealing conditions on resistive switching characteristics of SnOx thin films. JOURNAL OF ALLOYS AND COMPOUNDS, 673. 54 - 59.

This is the latest version of this item.

[img] Text
JAC manuscript.docx - Accepted Version

Download (12MB)
Item Type: Article
Uncontrolled Keywords: Tin compounds, Resistive switching, Annealing
Depositing User: Symplectic Admin
Date Deposited: 31 Oct 2016 11:59
Last Modified: 16 Jun 2021 07:49
DOI: 10.1016/j.jallcom.2016.02.215
Related URLs:
URI: https://livrepository.liverpool.ac.uk/id/eprint/3001864

Available Versions of this Item