Dispersion relation data for methylammonium lead triiodide perovskite deposited on a (100) silicon wafer using a two-step vapour-phase reaction process

Phillips, Laurie J ORCID: 0000-0001-5181-1565, Rashed, Atef M, Treharne, Robert E, Kay, James, Yates, Peter, Mitrovic, Ivona Z ORCID: 0000-0003-4816-8905, Weerakkody, Ayendra, Hall, Steve ORCID: 0000-0001-8387-1036 and Durose, Ken ORCID: 0000-0003-1183-3211 (2015) Dispersion relation data for methylammonium lead triiodide perovskite deposited on a (100) silicon wafer using a two-step vapour-phase reaction process. DATA IN BRIEF, 5. pp. 926-928.

Text Dispersion relation data for methylammonium lead triiodide perovskite deposited on a (100) silicon wafer using a two-step vapour-phase reaction process.pdf - Published version Download (122kB)

Abstract

Ellipsometry was used to measure the amplitude ratio and phase difference of light undergoing a phase shift as it interacts with a thin film of organic-inorganic hybrid perovskite CH3NH3PbI3 (MAPI) deposited onto a (100) silicon wafer. The refractive index and extinction coefficient was extracted from a multi-oscillator model fit to the ellipsometry data, as a function of wavelength, from 300 to 1500 nm.

Item Type:	Article
Depositing User:	Symplectic Admin
Date Deposited:	17 Oct 2016 08:57
Last Modified:	19 Jan 2023 07:29
DOI:	10.1016/j.dib.2015.10.026
Related URLs:	Author Publisher
URI:	https://livrepository.liverpool.ac.uk/id/eprint/3003797