Hard X -Ray Photoelectron Spectroscopy (HAXPES) characterisation of electrochemical passivation oxide layers on Al-Cr-Fe Complex Metallic Alloys (CMA).


Beni, A, Ott, N, Pawelkiewicz, M, Wardé, M, Young, K, Bauer, B, Rajput, P, Zegenhagen, J, McGrath, R ORCID: 0000-0002-9880-5741, Barthés-Labrousse, MG et al (show 2 more authors) (2014) Hard X -Ray Photoelectron Spectroscopy (HAXPES) characterisation of electrochemical passivation oxide layers on Al-Cr-Fe Complex Metallic Alloys (CMA). Electrochemistry Communications, 46. pp. 13-17.

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Abstract

A Hard X-ray Photoelectron Spectroscopy (HAXPES) characterisation of the passivation layers formed by electrochemical polarisation of Al–Cr–Fe complex metallic alloys is presented. By employing X-ray excitation energies from 2.3 to 10.0 keV, the depth distributions of Al- and Cr-oxide and hydroxide species in the (Al,Cr)-containing passive layers could be determined. Simultaneous analyses of the shallow Al 2s and deep Al 1s core level lines (respectively, more bulk- and surface-sensitive) provided complementary information to effectively determine the depth-resolved contributions of hydroxide and oxide species within the passivation layer. A Cr threshold concentration of 18 (at.%) was found for effective passivation at pH 1.

Item Type: Article
Additional Information: ## TULIP Type: Articles/Papers (Journal) ##
Uncontrolled Keywords: electrochemical passivation, Hard X-ray Photoelectron Spectroscopy (HAXPES), Al alloys, complex metallic alloys, composition depth profiling, oxide/hydroxide
Depositing User: Symplectic Admin
Date Deposited: 22 Feb 2017 10:42
Last Modified: 19 Jan 2023 07:19
DOI: 10.1016/j.elecom.2014.05.024
Related URLs:
URI: https://livrepository.liverpool.ac.uk/id/eprint/3005463
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