Physical and Electrical Characterization of Mg-Doped ZnO Thin-Film Transistors



Shaw, A, Whittles, TJ ORCID: 0000-0002-5154-7511, Mitrovic, IZ ORCID: 0000-0003-4816-8905, Jin, JD, Wrench, JS, Hesp, D, Dhanak, VR, Chalker, PR ORCID: 0000-0002-2295-6332 and Hall, S ORCID: 0000-0001-8387-1036
(2015) Physical and Electrical Characterization of Mg-Doped ZnO Thin-Film Transistors. .

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ESSDERC 2015 final.pdf - Accepted Version

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Item Type: Conference or Workshop Item (Unspecified)
Uncontrolled Keywords: Zinc Oxide (ZnO), Mg doped ZnO (MgZnO), thin-film transistors (TFTs), Modeling, X-ray photoemission spectroscopy (XPS), inverse photoemission spectroscopy (IPES), Ellipsometry
Depositing User: Symplectic Admin
Date Deposited: 15 Feb 2017 11:07
Last Modified: 09 Jan 2021 07:42
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URI: https://livrepository.liverpool.ac.uk/id/eprint/3005784