Experimental band alignment of Ta2O5/GaN for MIS-HEMT applications

Collapse authors list.
Sawangsri, K, Das, P ORCID: 0000-0003-1147-6541, Supardan, SN, Mitrovic, IZ, Hall, S ORCID: 0000-0001-8387-1036, Mahapatra, R, Chakraborty, AK, Treharne, R, Gibbon, J ORCID: 0000-0003-1548-0791, Dhanak, VR et al (show 2 more authors) , Durose, K ORCID: 0000-0003-1183-3211 and Chalker, PR ORCID: 0000-0002-2295-6332 (2017) Experimental band alignment of Ta2O5/GaN for MIS-HEMT applications. Microelectronic Engineering, 178. 178 - 181.

Text Manuscript_Sawangsri et al-revised-accepted copy.docx - Accepted Version Download (5MB)