Measurements of the reverse current of highly irradiated silicon sensors to determine the effective energy and current related damage rate



Wiehe, Moritz, Wonsak, S ORCID: 0000-0001-6122-2086, Kuehn, S, Parzefall, U and Casse, G ORCID: 0000-0002-8516-237X
(2018) Measurements of the reverse current of highly irradiated silicon sensors to determine the effective energy and current related damage rate. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 877. 51 - 55.

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Item Type: Article
Uncontrolled Keywords: Silicon sensors, High irradiation environment, Reverse current measurement, Current related damage rate, Effective energy
Depositing User: Symplectic Admin
Date Deposited: 06 Oct 2017 14:27
Last Modified: 01 Apr 2021 19:10
DOI: 10.1016/j.nima.2017.09.021
Open Access URL: https://doi.org/10.1016/j.nima.2017.09.021
Related URLs:
URI: https://livrepository.liverpool.ac.uk/id/eprint/3009828