Lu, Q
(2017)
Growth, Dielectrics Properties, and Reliability of High-k Thin Films Grown on Si and Ge Substrates.
PhD thesis, University of Liverpool.
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200945983_Jun2017.pdf Download (2MB) |
| Item Type: | Thesis (PhD) |
|---|---|
| Divisions: | Fac of Science & Engineering > School of Electrical Engineering, Electronics and Computer Science |
| Depositing User: | Symplectic Admin |
| Date Deposited: | 13 Aug 2018 09:03 |
| Last Modified: | 09 Jan 2021 06:12 |
| DOI: | 10.17638/03013042 |
| Supervisors: |
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| URI: | https://livrepository.liverpool.ac.uk/id/eprint/3013042 |
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