Recycled IC Detection through Aging Sensor

Rossi, D, Tenentes, V, Khursheed, S ORCID: 0000-0002-5720-0607 and Reddy, S (2018) Recycled IC Detection through Aging Sensor In: European Test Symposium, 2018-5-28 - 2018-6-1.

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Abstract

In this paper, we propose a novel technique to detect recycled ICs via an on-chip, coarse-grained aging sensor, which can be applied to low-power circuits featuring power gating. The sensor detects the increase in the power-rail discharge time of power-gated circuits, when the circuit enters the sleep condition. Through HSPICE simulations, we prove that power network discharge time (τ<inf>dV</inf>) is extremely sensitive to the age of the circuit. Indeed, after only 1 month of operation, τ<inf>dV</inf> increases by more than 3X and, after 1 year, its increase exceeds 7X. Our technique enables the detection of recycled ICs with a very high confidence and is a considerably more sensitive indicator of an aged device that alternative solutions relying on fine-grained performance degradation sensors.

Item Type:	Conference Item (Unspecified)
Uncontrolled Keywords:	40 Engineering, 46 Information and Computing Sciences, 4008 Electrical Engineering, 4009 Electronics, Sensors and Digital Hardware, 4605 Data Management and Data Science, Aging
Depositing User:	Symplectic Admin
Date Deposited:	18 Apr 2018 14:45
Last Modified:	01 Mar 2026 08:04
DOI:	10.1109/ETS.2018.8400713
Related Websites:	Author Publisher
URI:	https://livrepository.liverpool.ac.uk/id/eprint/3020325
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