The Fault Detection, Localization, and Tolerant Operation of Modular Multilevel Converters with an Insulated Gate Bipolar Transistor (IGBT) Open Circuit Fault



Li, Wei, Li, Gengyin, Zeng, Rong, Ni, Kai ORCID: 0000-0002-7467-2921, Hu, Yihua ORCID: 0000-0002-1007-1617 and Wen, Huiqing
(2018) The Fault Detection, Localization, and Tolerant Operation of Modular Multilevel Converters with an Insulated Gate Bipolar Transistor (IGBT) Open Circuit Fault. ENERGIES, 11 (4).

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Item Type: Article
Uncontrolled Keywords: modular multi-level converter, fault detection, circulating current, output current observation, fault localization, fault-tolerant operation
Depositing User: Symplectic Admin
Date Deposited: 08 Jun 2018 15:15
Last Modified: 18 Jun 2021 11:06
DOI: 10.3390/en11040837
Open Access URL: http://www.mdpi.com/1996-1073/11/4/837
Related URLs:
URI: https://livrepository.liverpool.ac.uk/id/eprint/3022096