Pilot capability evaluation of a feedback electronic imaging system prototype for in-process monitoring in electron beam additive manufacturing



Wong, Hay ORCID: 0000-0003-1717-2653, Neary, Derek, Jones, Eric, Fox, Peter ORCID: 0000-0003-3442-8630 and Sutcliffe, Chris
(2019) Pilot capability evaluation of a feedback electronic imaging system prototype for in-process monitoring in electron beam additive manufacturing. INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, 100 (1-4). 707 - 720.

[img] Text
Wong2018_Article_PilotCapabilityEvaluationOfAFe.pdf - OA Published Version

Download (8MB)
Item Type: Article
Uncontrolled Keywords: Additive manufacturing, Electron beam melting, Metallic materials, In-process monitoring, Quality control, Electronic imaging, Secondary electrons, Backscattered electrons
Depositing User: Symplectic Admin
Date Deposited: 15 Oct 2018 10:31
Last Modified: 16 Sep 2022 07:47
DOI: 10.1007/s00170-018-2702-6
Related URLs:
URI: https://livrepository.liverpool.ac.uk/id/eprint/3027588