Detection of Recycled ICs via On-Chip Leakage Current Sensors

Khursheed, S and Rossi, Daniele (2019) Detection of Recycled ICs via On-Chip Leakage Current Sensors In: 4th International Verification and Security Workshop (IVSW), 2019-7-1 - 2019-7-3, Rhodes Island, Greece.

Text IVSW_2019_paper_12.pdf - Author Accepted Manuscript Access to this file is restricted: awaiting official publication and publisher embargo. Download (558kB)

Item Type:	Conference Item (Unspecified)
Depositing User:	Symplectic Admin
Date Deposited:	04 Jul 2019 15:23
Last Modified:	19 Jan 2023 00:38
URI:	https://livrepository.liverpool.ac.uk/id/eprint/3048623
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