Detection of Recycled ICs via On-Chip Leakage Current Sensors



Khursheed, S and Rossi, Daniele
(2019) Detection of Recycled ICs via On-Chip Leakage Current Sensors. In: 4th International Verification and Security Workshop (IVSW), 2019-07-01 - 2019-07-03, Rhodes Island, Greece.

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Item Type: Conference or Workshop Item (Unspecified)
Depositing User: Symplectic Admin
Date Deposited: 04 Jul 2019 15:23
Last Modified: 09 Jan 2021 03:26
URI: https://livrepository.liverpool.ac.uk/id/eprint/3048623