Guest Editorial: Defect and Fault Tolerance in VLSI and Nanotechnology Systems



Miele, Antonio, Trefzer, Martin A and Khursheed, Saqib
(2019) Guest Editorial: Defect and Fault Tolerance in VLSI and Nanotechnology Systems. IET COMPUTERS AND DIGITAL TECHNIQUES, 13 (3). 127 - 128.

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Item Type: Article
Depositing User: Symplectic Admin
Date Deposited: 04 Jul 2019 15:40
Last Modified: 19 Aug 2022 18:12
DOI: 10.1049/iet-cdt.2019.0097
Related URLs:
URI: https://livrepository.liverpool.ac.uk/id/eprint/3048630