Guest Editorial: Defect and Fault Tolerance in VLSI and Nanotechnology Systems

Miele, A, Trefzer, MA and Khursheed, S ORCID: 0000-0002-5720-0607 (2019) Guest Editorial: Defect and Fault Tolerance in VLSI and Nanotechnology Systems Iet Computers and Digital Techniques, 13 (3). pp. 127-128. ISSN 1751-8601, 1751-861X

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Official URL: https://doi.org/10.1049/iet-cdt.2019.0097

Item Type:	Article
Uncontrolled Keywords:	4606 Distributed Computing and Systems Software, 46 Information and Computing Sciences, 40 Engineering, 4009 Electronics, Sensors and Digital Hardware
Depositing User:	Symplectic Admin
Date Deposited:	04 Jul 2019 15:40
Last Modified:	01 Mar 2026 08:31
DOI:	10.1049/iet-cdt.2019.0097
Related Websites:	Author Publisher
URI:	https://livrepository.liverpool.ac.uk/id/eprint/3048630
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