Fang, YX, Zhao, C, Mitrovic, IZ 
ORCID: 0000-0003-4816-8905, Hall, S ORCID: 0000-0001-8387-1036, Yang, L and Zhao, CC
(2019)
Bias-stress stability and radiation response of solution-processed AlOx dielectrics investigated by on-site measurements.
Microelectronic Engineering.
|
Text
X Fang et al MEE Aug 2019.pdf - Author Accepted Manuscript Download (959kB) | Preview |
|
|
Text
Fang et al-MEE-accepted manuscript-22 Aug 2019.pdf - Author Accepted Manuscript Download (753kB) | Preview |
| Item Type: | Article |
|---|---|
| Depositing User: | Symplectic Admin |
| Date Deposited: | 27 Aug 2019 08:51 |
| Last Modified: | 19 Jan 2023 00:28 |
| DOI: | 10.1016/j.mee.2019.111113 |
| URI: | https://livrepository.liverpool.ac.uk/id/eprint/3052421 |
Dimensions
Dimensions
DimensionsAltmetric
Share
CORE (COnnecting REpositories)