Lu, Qifeng, Zhao, Ce Zhou, Zhao, Chun, Taylor, Steve and Chalker, Paul R ORCID: 0000-0002-2295-6332
(2017)
Investigation of Anomalous Capacitance-Voltage Behavior Caused by Interface Dipoles and the Effect of Post-Metal-Annealing.
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Item Type: | Conference or Workshop Item (Unspecified) |
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Uncontrolled Keywords: | Anomalous capacitance-voltage, MOS, Zr(NMe2)(4) |
Depositing User: | Symplectic Admin |
Date Deposited: | 16 Jan 2020 15:48 |
Last Modified: | 09 Jan 2021 09:47 |
DOI: | 10.1063/1.4999875 |
Related URLs: | |
URI: | https://livrepository.liverpool.ac.uk/id/eprint/3070874 |
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