Coverage-Guided Testing for Recurrent Neural Networks

Huang, Wei, Sun, Youcheng, Zhao, Xingyu ORCID: 0000-0002-3474-349X, Sharp, James, Ruan, Wenjie, Meng, Jie and Huang, Xiaowei ORCID: 0000-0001-6267-0366
(2021) Coverage-Guided Testing for Recurrent Neural Networks. IEEE TRANSACTIONS ON RELIABILITY.

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Item Type: Article
Uncontrolled Keywords: Measurement, Testing, Tools, Semantics, Recurrent neural networks, Software, Logic gates, Coverage-guided testing, coverage metrics, recurrent neural networks (RNNs), test case generation
Divisions: Faculty of Science and Engineering > School of Electrical Engineering, Electronics and Computer Science
Depositing User: Symplectic Admin
Date Deposited: 20 May 2021 09:20
Last Modified: 16 Sep 2022 08:19
DOI: 10.1109/TR.2021.3080664
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