A promising method to improve the bias-stress and biased-radiation-stress stabilities of solution-processed AlOx thin films



Fang, Yuxiao, Xu, Wangying, Zhao, Tianshi, Mitrovic, Ivona Z ORCID: 0000-0003-4816-8905, Yang, Li ORCID: 0000-0002-1040-4223, Zhao, Chun and Zhao, Cezhou
(2022) A promising method to improve the bias-stress and biased-radiation-stress stabilities of solution-processed AlOx thin films. Radiation Physics and Chemistry, 192. 109899 - 109899.

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Item Type: Article
Divisions: Faculty of Science and Engineering > School of Electrical Engineering, Electronics and Computer Science
Faculty of Science and Engineering > School of Physical Sciences
Depositing User: Symplectic Admin
Date Deposited: 31 Jan 2022 08:24
Last Modified: 19 Aug 2022 07:25
DOI: 10.1016/j.radphyschem.2021.109899
URI: https://livrepository.liverpool.ac.uk/id/eprint/3147813