Yuan, Xiao-Jie
(1995)
Hot electron transport, trapping and induced trap generation in advanced MOS devices.
PhD thesis, University of Liverpool.
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| Item Type: | Thesis (PhD) |
|---|---|
| Depositing User: | Symplectic Admin |
| Date Deposited: | 02 May 2025 10:12 |
| Last Modified: | 02 May 2025 20:00 |
| DOI: | 10.17638/03192305 |
| Copyright Statement: | Copyright © and Moral Rights for this thesis and any accompanying data (where applicable) are retained by the author and/or other copyright owners. A copy can be downloaded for personal non-commercial research or study, without prior permission or charge. |
| URI: | https://livrepository.liverpool.ac.uk/id/eprint/3192305 |
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