Enhanced low voltage nonlinearity in resonant tunneling metal-insulator-insulator-metal nanostructures



Weerakkody, AD, Sedghi, N ORCID: 0000-0002-2004-6159, Mitrovic, IZ ORCID: 0000-0003-4816-8905, van Zalinge, H ORCID: 0000-0003-0996-1281, Noureddine, I Nemr, Hall, S ORCID: 0000-0001-8387-1036, Wrench, JS, Chalker, PR, Phillips, LJ ORCID: 0000-0001-5181-1565, Treharne, R
et al (show 1 more authors) (2015) Enhanced low voltage nonlinearity in resonant tunneling metal-insulator-insulator-metal nanostructures. MICROELECTRONIC ENGINEERING, 147. pp. 298-301.

[img] Text
Manuscrpit_Weerakkody-et al-revised-accepted.docx - Author Accepted Manuscript

Download (664kB)

Abstract

The electrical properties of bi-layer Ta<inf>2</inf>O<inf>5</inf>/Al<inf>2</inf>O<inf>3</inf> and Nb<inf>2</inf>O<inf>5</inf>/Al<inf>2</inf>O<inf>3</inf> metal-insulator-insulator-metal nanostructures as rectifiers have been investigated. The ultra-thin (1-6 nm) insulator layers were deposited by atomic-layer deposition or rf magnetron sputtering with Al as metal contacts. Variable angle spectroscopic ellipsometry was performed to extract the optical properties and band gap of narrow band gap insulator layers while the surface roughness of the metal contacts was measured by atomic force microscopy. Superior low voltage large signal and small signal nonlinearities such as asymmetry of 18 at 0.35 V, rate of change of non-linearity of 7.5 V<sup>-1</sup>, and responsivity of 9 A/W at 0.2 V were observed from the current-voltage characteristics. A sharp increase in current at ∼2 V on Ta<inf>2</inf>O<inf>5</inf>/Al<inf>2</inf>O<inf>3</inf> device can be ascribed to resonant tunneling.

Item Type: Article
Uncontrolled Keywords: Metal-insulator-insulator-metal, nanorectifiers, Nonlinearity, Resonant tunneling
Depositing User: Symplectic Admin
Date Deposited: 06 Feb 2017 09:17
Last Modified: 15 Mar 2024 03:08
DOI: 10.1016/j.mee.2015.04.110
Related URLs:
URI: https://livrepository.liverpool.ac.uk/id/eprint/3005568