Lu, Q
(2017)
Growth, Dielectrics Properties, and Reliability of High-k Thin Films Grown on Si and Ge Substrates.
PhD thesis, University of Liverpool.
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200945983_Jun2017.pdf - Unspecified Download (2MB) |
Item Type: | Thesis (PhD) |
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Divisions: | Faculty of Science and Engineering > School of Electrical Engineering, Electronics and Computer Science |
Depositing User: | Symplectic Admin |
Date Deposited: | 13 Aug 2018 09:03 |
Last Modified: | 19 Jan 2023 06:49 |
DOI: | 10.17638/03013042 |
Supervisors: |
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URI: | https://livrepository.liverpool.ac.uk/id/eprint/3013042 |
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