Growth of a bismuth thin film on the five-fold surface of the icosahedral Ag-In-Yb quasicrystal



Hars, SS, Sharma, HR ORCID: 0000-0003-0456-6258, Smerdon, JA, Coates, S ORCID: 0000-0002-8408-1703, Nozawa, K, Tsai, AP and McGrath, R ORCID: 0000-0002-9880-5741
(2018) Growth of a bismuth thin film on the five-fold surface of the icosahedral Ag-In-Yb quasicrystal. SURFACE SCIENCE, 678. pp. 222-227.

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Abstract

We present a study of growth of quasicrystalline bismuth (Bi) thin films on the five-fold surface of the icosahedral Ag-In-Yb quasicrystal using scanning tunnelling microscopy (STM). The main building block of the Ag-In-Yb quasicrystal is a rhombic triacontahedral (RTH) cluster, which is formed by successive shells of atoms. The surface is formed at bulk planes which intersect the centres of the RTH clusters. We show that the deposited Bi atoms occupy vacant sites above the surface where the atoms of the RTH clusters would be and thus Bi grows with three-dimensional quasicrystalline order. Further deposition of Bi yields crystalline Bi islands aligned along high symmetry directions of the substrate.

Item Type: Article
Uncontrolled Keywords: Quasicrystals, Surfaces, Thin films, Scanning tunnelling microscopy, Bismuth
Depositing User: Symplectic Admin
Date Deposited: 03 May 2018 09:49
Last Modified: 19 Jan 2023 06:34
DOI: 10.1016/j.susc.2018.04.023
Related URLs:
URI: https://livrepository.liverpool.ac.uk/id/eprint/3020770