Guest Editorial: Defect and Fault Tolerance in VLSI and Nanotechnology Systems

Miele, Antonio, Trefzer, Martin A and Khursheed, Saqib (2019) Guest Editorial: Defect and Fault Tolerance in VLSI and Nanotechnology Systems. IET COMPUTERS AND DIGITAL TECHNIQUES, 13 (3). pp. 127-128.

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Official URL: http://dx.doi.org/10.1049/iet-cdt.2019.0097

Item Type:	Article
Depositing User:	Symplectic Admin
Date Deposited:	04 Jul 2019 15:40
Last Modified:	27 Nov 2023 09:13
DOI:	10.1049/iet-cdt.2019.0097
Related URLs:	Author Publisher
URI:	https://livrepository.liverpool.ac.uk/id/eprint/3048630