Wong, Hay 
ORCID: 0000-0003-1717-2653, Garrard, Rebecca, Black, Kate ORCID: 0000-0003-3638-6518, Fox, Peter ORCID: 0000-0003-3442-8630 and Sutcliffe, Chris
(2020)
Material characterisation using electronic imaging for Electron Beam Melting process monitoring.
MANUFACTURING LETTERS, 23.
pp. 44-48.
|
Text
1-s2.0-S2213846319301439-main.pdf - Author Accepted Manuscript Download (728kB) | Preview |
Abstract
In-situ process monitoring in Electron Beam Melting (EBM) is critical in certifying build quality, by identifying contamination from the feedstock and condensate spallation from within the build area. The chamber condition in an EBM machine is different from a typical electron microscope. Therefore this study explores in-situ EBM material characterisation with a custom electronic imaging prototype. Typical contamination elements found in a popular EBM material (Ti-6Al-4V) were electronically imaged at room temperature. Material contrast is observed in the electronic images generated by the prototype. This trial is thought to serve as a baseline study for future EBM monitoring system development.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | Electron Beam Melting, Material characterisation, Quality control, In-situ, Additive manufacturing |
| Depositing User: | Symplectic Admin |
| Date Deposited: | 02 Jan 2020 15:40 |
| Last Modified: | 19 Jan 2023 00:11 |
| DOI: | 10.1016/j.mfglet.2019.12.005 |
| Related URLs: | |
| URI: | https://livrepository.liverpool.ac.uk/id/eprint/3068862 |
Dimensions
Dimensions
