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Reddy, Raviteja P, Acharyya, Amit ORCID: 0000-0002-5636-0676 and Khursheed, Saqib
(2017) A Cost-Effective Fault Tolerance Technique for Functional TSV in 3-D ICs. IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 25 (7). 2071 - 2080.


Reddy, Raviteja, Acharyya, Amit and Khursheed, S
(2019) A Framework for TSV based 3D-IC to Analyze Aging and TSV Thermo-mechanical stress on Soft Errors. In: International Test Conference-Asia, 2019-09-03 - 2019-09-05, Tokyo, Japan.

This list was generated on Mon Oct 14 20:32:01 2019 BST.