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Number of items: 2.
Tenentes, Vasileios, Rossi, Daniele, Yang, Sheng, Khursheed, S, Al-Hashimi, BM and Gunn, Steve R
(2017)
Coarse-grained Online Monitoring of BTI Aging by Reusing Power Gating Infrastructure.
IEEE Transactions on Very Large Scale Integration Systems, 25 (4).
pp. 1397-1407.
Rossi, D, Tenentes, V, Yang, S, Khursheed, S and Al-Hashimi, BM
(2016)
Reliable Power Gating With NBTI Aging Benefits.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 24 (8).
pp. 2735-2744.