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Tenentes, Vasileios, Rossi, Daniele, Yang, Sheng, Khursheed, S, Al-Hashimi, BM and Gunn, Steve R
(2017) Coarse-grained Online Monitoring of BTI Aging by Reusing Power Gating Infrastructure. IEEE Transactions on Very Large Scale Integration Systems, 25 (4). 1397 - 1407.


Rossi, D, Tenentes, V, Yang, S, Khursheed, S and Al-Hashimi, BM
(2016) Reliable Power Gating With NBTI Aging Benefits. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 24 (8). 2735 - 2744.

This list was generated on Wed Oct 21 05:08:19 2020 BST.