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Rossi, Daniele, Tenentes, Vasileios, Yang, Sheng, Khursheed, Saqib and Al-Hashimi, Bashir M
(2017)
Aging Benefits in Nanometer CMOS Designs.
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 64 (3).
324 - 328.
Tenentes, Vasileios, Rossi, Daniele, Yang, Sheng, Khursheed, Saqib, Al-Hashimi, Bashir M and Gunn, Steve R
(2017)
Coarse-Grained Online Monitoring of BTI Aging by Reusing Power-Gating Infrastructure.
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 25 (4).
1397 - 1407.
Tenentes, Vasileios, Khursheed, Saqib, Rossi, Daniele, Yang, Sheng and Al-Hashimi, Bashir M
(2015)
DFT Architecture With Power-Distribution-Network Consideration for Delay-Based Power Gating Test.
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 34 (12).
2013 - 2024.
Khursheed, Saqib, Shi, Kan, Al-Hashimi, Bashir M, Wilson, Peter R and Chakrabarty, Krishnendu
(2014)
Delay Test for Diagnosis of Power Switches.
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 22 (2).
197 - 206.
Khursheed, Saqib, Al-Hashimi, Bashir M, Reddy, Sudhakar M and Harrod, Peter
(2009)
Diagnosis of Multiple-Voltage Design With Bridge Defect.
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 28 (3).
406 - 416.
Zhong, Shida, Khursheed, Saqib and Al-Hashimi, Bashir M
(2011)
A Fast and Accurate Process Variation-Aware Modeling Technique for Resistive Bridge Defects.
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 30 (11).
1719 - 1730.
Khursheed, Saqib, Al-Hashimi, Bashir M, Chakrabarty, Krishnendu and Harrod, Peter
(2010)
Gate-Sizing-Based Single V-dd Test for Bridge Defects in Multivoltage Designs.
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 29 (9).
1409 - 1421.
Tenentes, Vasileios, Rossi, Daniele, Khursheed, Saqib, Al-Hashimi, Bashir M and Chakrabarty, Krishnendu
(2018)
Leakage Current Analysis for Diagnosis of Bridge Defects in Power-Gating Designs.
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 37 (4).
883 - 895.
Zhao, Yi, Khursheed, Saqib and Al-Hashimi, Bashir M
(2015)
Online Fault Tolerance Technique for TSV-Based 3-D-IC.
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 23 (8).
1567 - 1571.
Ingelsson, Urban, Al-Hashimi, Bashir M, Khursheed, Saqib, Reddy, Sudhakar M and Harrod, Peter
(2009)
Process Variation-Aware Test for Resistive Bridges.
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 28 (8).
1269 - 1274.
Rossi, Daniele, Tenentes, Vasileios, Yang, Sheng, Khursheed, Saqib and Al-Hashimi, Bashir M
(2016)
Reliable Power Gating With NBTI Aging Benefits.
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 24 (8).
2735 - 2744.
Yang, Sheng, Khursheed, Saqib, Al-Hashimi, Bashir M, Flynn, David and Idgunji, Sachin
(2011)
Reliable State Retention-Based Embedded Processors Through Monitoring and Recovery.
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 30 (12).
1773 - 1785.