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Rossi, Daniele, Tenentes, Vasileios, Yang, Sheng, Khursheed, Saqib and Al-Hashimi, Bashir M (2017) Aging Benefits in Nanometer CMOS Designs. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 64 (3). 324 - 328.

Tenentes, Vasileios, Khursheed, Saqib, Rossi, Daniele, Yang, Sheng and Al-Hashimi, Bashir M (2015) DFT Architecture With Power-Distribution-Network Consideration for Delay-Based Power Gating Test. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 34 (12). 2013 - 2024.

Khursheed, Saqib, Shi, Kan, Al-Hashimi, Bashir M, Wilson, Peter R and Chakrabarty, Krishnendu (2014) Delay Test for Diagnosis of Power Switches. IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 22 (2). 197 - 206.

Khursheed, Saqib, Al-Hashimi, Bashir M, Reddy, Sudhakar M and Harrod, Peter (2009) Diagnosis of Multiple-Voltage Design With Bridge Defect. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 28 (3). 406 - 416.

Zhong, Shida, Khursheed, Saqib and Al-Hashimi, Bashir M (2011) A Fast and Accurate Process Variation-Aware Modeling Technique for Resistive Bridge Defects. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 30 (11). 1719 - 1730.

Khursheed, Saqib, Al-Hashimi, Bashir M, Chakrabarty, Krishnendu and Harrod, Peter (2010) Gate-Sizing-Based Single V-dd Test for Bridge Defects in Multivoltage Designs. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 29 (9). 1409 - 1421.

Tenentes, Vasileios, Rossi, Daniele, Khursheed, S Saqib, Al-Hashimi, Bashir M and Chakrabarty, Krishnendu (2018) Leakage Current Analysis for Diagnosis of Bridge Defects in Power-Gating Designs. IEEE Transactions on Computer - Aided Design of Integrated Circuits and Systems, 37 (4). 883 - 895.

Zhao, Yi, Khursheed, Saqib and Al-Hashimi, Bashir M (2015) Online Fault Tolerance Technique for TSV-Based 3-D-IC. IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 23 (8). 1567 - 1571.

Ingelsson, Urban, Al-Hashimi, Bashir M, Khursheed, Saqib, Reddy, Sudhakar M and Harrod, Peter (2009) Process Variation-Aware Test for Resistive Bridges. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 28 (8). 1269 - 1274.

Yang, Sheng, Khursheed, Saqib, Al-Hashimi, Bashir M, Flynn, David and Idgunji, Sachin (2011) Reliable State Retention-Based Embedded Processors Through Monitoring and Recovery. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 30 (12). 1773 - 1785.