![]() | Up a level |
Rossi, Daniele, Tenentes, Vasileios, Yang, Sheng, Khursheed, Saqib and Al-Hashimi, Bashir M
(2017)
Aging Benefits in Nanometer CMOS Designs.
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 64 (3).
pp. 324-328.
Tenentes, Vasileios, Khursheed, Saqib, Rossi, Daniele, Yang, Sheng and Al-Hashimi, Bashir M
(2015)
DFT Architecture With Power-Distribution-Network Consideration for Delay-Based Power Gating Test.
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 34 (12).
pp. 2013-2024.
Khursheed, Saqib, Shi, Kan, Al-Hashimi, Bashir M, Wilson, Peter R and Chakrabarty, Krishnendu
(2014)
Delay Test for Diagnosis of Power Switches.
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 22 (2).
pp. 197-206.
Khursheed, Saqib, Al-Hashimi, Bashir M, Reddy, Sudhakar M and Harrod, Peter
(2009)
Diagnosis of Multiple-Voltage Design With Bridge Defect.
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 28 (3).
pp. 406-416.
Zhong, Shida, Khursheed, Saqib and Al-Hashimi, Bashir M
(2011)
A Fast and Accurate Process Variation-Aware Modeling Technique for Resistive Bridge Defects.
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 30 (11).
pp. 1719-1730.
Khursheed, Saqib, Al-Hashimi, Bashir M, Chakrabarty, Krishnendu and Harrod, Peter
(2010)
Gate-Sizing-Based Single V-dd Test for Bridge Defects in Multivoltage Designs.
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 29 (9).
pp. 1409-1421.
Tenentes, Vasileios, Rossi, Daniele, Khursheed, S Saqib, Al-Hashimi, Bashir M and Chakrabarty, Krishnendu
(2018)
Leakage Current Analysis for Diagnosis of Bridge Defects in Power-Gating Designs.
IEEE Transactions on Computer - Aided Design of Integrated Circuits and Systems, 37 (4).
pp. 883-895.
Zhao, Yi, Khursheed, Saqib and Al-Hashimi, Bashir M
(2015)
Online Fault Tolerance Technique for TSV-Based 3-D-IC.
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 23 (8).
pp. 1567-1571.
Ingelsson, Urban, Al-Hashimi, Bashir M, Khursheed, Saqib, Reddy, Sudhakar M and Harrod, Peter
(2009)
Process Variation-Aware Test for Resistive Bridges.
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 28 (8).
pp. 1269-1274.
Yang, Sheng, Khursheed, Saqib, Al-Hashimi, Bashir M, Flynn, David and Idgunji, Sachin
(2011)
Reliable State Retention-Based Embedded Processors Through Monitoring and Recovery.
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 30 (12).
pp. 1773-1785.