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Sun, Youcheng, Huang, Xiaowei ORCID: 0000-0001-6267-0366, Kroening, Daniel, Sharp, James, Hill, Matthew, Ashmore, Rob and IEEE,
(2019) Structural Test Coverage Criteria for Deep Neural Networks. 2019 IEEE/ACM 41ST INTERNATIONAL CONFERENCE ON SOFTWARE ENGINEERING: COMPANION PROCEEDINGS (ICSE-COMPANION 2019). 320 - 321.


Sun, Youcheng, Huang, Xiaowei ORCID: 0000-0001-6267-0366, Kroening, Daniel, Sharp, James, Hill, Matthew and Ashmore, Rob
(2019) Structural Test Coverage Criteria for Deep Neural Networks. ACM Transactions on Embedded Computing Systems, 18 (5S).

This list was generated on Mon Jan 18 15:42:35 2021 GMT.