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Zhang, JY, Li, WW, Hoye, RLZ, MacManus-Driscoll, JL, Budde, M, Bierwagen, O, Wang, L, Du, Y, Wahila, MJ, Piper, LFJ et al (show 4 more authors) , Lee, TL, Edwards, HJ, Dhanak, VR and Zhang, KHL (2018) Electronic and transport properties of Li-doped NiO epitaxial thin films. Journal of Materials Chemistry C, 6 (9). pp. 2275-2282.

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Zhang, JY, Li, WW, Hoye, RLZ, MacManus-Driscoll, JL, Budde, M, Bierwagen, O, Wang, L, Du, Y, Wahila, MJ, Piper, LFJ et al (show 4 more authors) , Lee, T-L, Edwards, HJ, Dhanak, VR and Zhang, KHL (2018) Electronic and transport properties of Li-doped NiO epitaxial thin films (vol 6, pg 2275, 2018). JOURNAL OF MATERIALS CHEMISTRY C, 6 (15). p. 4326.

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Witt, SH, Streit, F, Jungkunz, M, Frank, J, Awasthi, S, Reinbold, CS, Treutlein, J, Degenhardt, F, Forstner, AJ, Heilmann-Heimbach, S et al (show 144 more authors) , Dietl, L, Schwarze, CE, Schendel, D, Strohmaier, J, Abdellaoui, A, Adolfsson, R, Air, TM, Akil, H, Alda, M, Alliey-Rodriguez, N, Andreassen, OA, Babadjanova, G, Bass, NJ, Bauer, M, Baune, BT, Bellivier, F, Bergen, S, Bethell, A ORCID: 0000-0002-6792-9143, Biernacka, JM, Blackwood, DHR, Boks, MP, Boomsma, DI, Borglum, AD, Borrmann-Hassenbach, M, Brennan, P, Budde, M, Buttenschon, HN, Byrne, EM, Cervantes, P, Clarke, T-K, Craddock, N, Cruceanu, C, Curtis, D, Czerski, PM, Dannlowski, U, Davis, T, de Geus, EJC, Di Florio, A, Djurovic, S, Domenici, E, Edenberg, HJ, Etain, B, Fischer, SB, Forty, L, Fraser, C, Frye, MA, Fullerton, JM, Gade, K, Gershon, ES, Giegling, I, Gordon, SD, Gordon-Smith, K, Grabe, HJ, Green, EK, Greenwood, TA, Grigoroiu-Serbanescu, M, Guzman-Parra, J, Hall, LS, Hamshere, M, Hauser, J, Hautzinger, M, Heilbronner, U, Herms, S, Hitturlingappa, S, Hoffmann, P, Holmans, P, Hottenga, J-J, Jamain, S, Jones, I, Jones, LA, Jureus, A, Kahn, RS, Kammerer-Ciernioch, J, Kirov, G, Kittel-Schneider, S, Kloiber, S, Knott, SV, Kogevinas, M, Landen, M, Leber, M, Leboyer, M, Li, QS, Lissowska, J, Lucae, S, Martin, NG, Mayoral-Cleries, F, McElroy, SL, McIntosh, AM, McKay, JD, McQuillin, A, Medland, SE, Middeldorp, CM, Milaneschi, Y, Mitchell, PB, Montgomery, GW, Morken, G, Mors, O, Muehleisen, TW, Mueller-Myhsok, B ORCID: 0000-0002-0719-101X, Myers, RM, Nievergelt, CM, Nurnberger, JI, O'Donovan, MC, Loohuis, LMO, Ophoff, R, Oruc, L, Owen, MJ, Paciga, SA, Penninx, BWJH, Perry, A, Pfennig, A, Potash, JB, Preisig, M, Reif, A, Rivas, F, Rouleau, GA, Schofield, PR, Schulze, TG, Schwarz, M, Scott, L, Sinnamon, GCB, Stahl, EA, Strauss, J, Turecki, G, Van der Auwera, S, Vedder, H, Vincent, JB, Willemsen, G, Witt, CC, Wray, NR, Xi, HS, Tadic, A, Dahmen, N, Schott, BH, Cichon, S, Noethen, MM, Ripke, S, Mobascher, A, Rujescu, D, Lieb, K, Roepke, S, Schmahl, C, Bohus, M and Rietschel, M (2017) Genome-wide association study of borderline personality disorder reveals genetic overlap with bipolar disorder, major depression and schizophrenia. TRANSLATIONAL PSYCHIATRY, 7 (6). e1155-.