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Khursheed, Saqib, Shi, Kan, Al-Hashimi, Bashir M, Wilson, Peter R and Chakrabarty, Krishnendu
(2014)
Delay Test for Diagnosis of Power Switches.
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 22 (2).
pp. 197-206.
Khursheed, Saqib, Al-Hashimi, Bashir M, Chakrabarty, Krishnendu and Harrod, Peter
(2010)
Gate-Sizing-Based Single V<sub>dd</sub> Test for Bridge Defects in Multivoltage Designs.
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 29 (9).
pp. 1409-1421.
Tenentes, Vasileios, Rossi, Daniele, Khursheed, S Saqib, Al-Hashimi, Bashir M and Chakrabarty, Krishnendu
(2018)
Leakage Current Analysis for Diagnosis of Bridge Defects in Power-Gating Designs.
IEEE Transactions on Computer - Aided Design of Integrated Circuits and Systems, 37 (4).
pp. 883-895.