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Mitrovic, IZ ORCID: 0000-0003-4816-8905, Hall, S ORCID: 0000-0001-8387-1036, Althobaiti, M, Hesp, D, Dhanak, V, Santoni, A, Weerakkody, D, Sedghi, N ORCID: 0000-0002-2004-6159, Chalker, P ORCID: 0000-0002-2295-6332, Henkel, C
et al (show 5 more authors) (2015) Atomic-layer deposited thulium oxide as a passivation layer on germanium. Journal of Applied Physics, 117 (21).


Supardan, S, Mitrovic, IZ ORCID: 0000-0003-4816-8905, Hesp, D, Dhanak, VR, Hall, S ORCID: 0000-0001-8387-1036, Schamm-Chardon, S, Dentoni Litta, E, Hellstrom, P-E and Ostling, M
(2016) Rare-earth oxide interfacial layer for sub-nm EOT CMOS technology. In: 3rd International Conference on Nanotechnology, Nanomaterials and Thin Films for Energy Applications, 2016-07-27 - 2016-07-29, University of Liverpool.


Mitrovic, IZ ORCID: 0000-0003-4816-8905, Supardan, SN, Hesp, D, Dhanak, VR, Hall, S ORCID: 0000-0001-8387-1036, Schamm-Chardon, S, Dentoni Litta, E, Hellstrom, P-E and Ostling, M
(2016) Structure of the interface in sub-nm EOT TmSiO/HfO2 gate stack. In: 19th Workshop on Dielectrics in Microelectronics –WODIM 2016, 2016-06-27 - 2016-06-30, Catania, Italy.

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