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Gibson, QD, Dyer, MS ORCID: 0000-0002-4923-3003, Whitehead, GFS, Alaria, J ORCID: 0000-0001-5868-0318, Pitcher, MJ ORCID: 0000-0003-2044-6774, Edwards, HJ, Claridge, JB ORCID: 0000-0003-4849-6714, Zanella, M ORCID: 0000-0002-6164-6169, Dawson, K ORCID: 0000-0003-3249-8328, Manning, TD ORCID: 0000-0002-7624-4306 et al (show 2 more authors)
(2017)
Bi4O4Cu1.7Se2.7Cl0.3: an intergrowth of BiOCuSe and Bi2O2Se stabilized by the addition of a third anion.
Journal of the American Chemical Society, 139 (44).
pp. 15568-15571.
Paul, AD, Biswas, S, Das, P ORCID: 0000-0003-1147-6541, Edwards, HJ, Dhanak, VR ORCID: 0000-0001-8053-654X and Mahapatra, R
(2020)
Effect of Aluminum Doping on Performance of HfO<i><sub>x</sub></i>-Based Flexible Resistive Memory Devices.
IEEE TRANSACTIONS ON ELECTRON DEVICES, 67 (10).
pp. 4222-4227.
Zhang, JY, Li, WW, Hoye, RLZ, MacManus-Driscoll, JL, Budde, M, Bierwagen, O, Wang, L, Du, Y, Wahila, MJ, Piper, LFJ et al (show 4 more authors)
(2018)
Electronic and transport properties of Li-doped NiO epitaxial thin films.
Journal of Materials Chemistry C, 6 (9).
pp. 2275-2282.
Zhang, JY, Li, WW, Hoye, RLZ, MacManus-Driscoll, JL, Budde, M, Bierwagen, O, Wang, L, Du, Y, Wahila, MJ, Piper, LFJ et al (show 4 more authors)
(2018)
Electronic and transport properties of Li-doped NiO epitaxial thin films (vol 6, pg 2275, 2018).
JOURNAL OF MATERIALS CHEMISTRY C, 6 (15).
p. 4326.
Biswas, S, Paul, AD, Das, P ORCID: 0000-0003-1147-6541, Tiwary, P, Edwards, HJ, Dhanak, VR ORCID: 0000-0001-8053-654X, Mitrovic, IZ ORCID: 0000-0003-4816-8905 and Mahapatra, R
(2021)
Impact of AlO<i><sub>y</sub></i> Interfacial Layer on Resistive Switching Performance of Flexible HfO<i><sub>x</sub></i>/AlO<i><sub>y</sub></i> ReRAMs.
IEEE TRANSACTIONS ON ELECTRON DEVICES, 68 (8).
pp. 3787-3793.
Garza-Hernandez, R, Edwards, HJ, Gibbon, JT, Alfaro-Cruz, MR, Dhanak, VR ORCID: 0000-0001-8053-654X and Aguirre-Tostado, FS
(2021)
Tunable crystal structure of Cu<sub>2</sub>SnS<sub>3</sub> deposited by spray pyrolysis and its impact on the chemistry and electronic structure.
JOURNAL OF ALLOYS AND COMPOUNDS, 881.
p. 160552.