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Fang, YX, Zhao, C, Mitrovic, IZ ORCID: 0000-0003-4816-8905, Hall, S ORCID: 0000-0001-8387-1036, Yang, L and Zhao, CZ
(2019) Bias-stress stability and radiation response of solution-processed AlOx dielectrics investigated by on-site measurements. In: Insulating Films on Semiconductors, INFOS 2019, 2019-6-30 - 2019-7-3, Clare College, University of Cambridge, UK.


Fang, YX, Zhao, C, Mitrovic, IZ ORCID: 0000-0003-4816-8905, Hall, S ORCID: 0000-0001-8387-1036, Yang, L and Zhao, CC
(2019) Bias-stress stability and radiation response of solution-processed AlOx dielectrics investigated by on-site measurements. Microelectronic Engineering.


Fang, YX, Xu, WY, Mitrovic, IZ ORCID: 0000-0003-4816-8905, Yang, L, Zhao, C and Zhao, CZ
(2021) An environmentally friendly solution-processed ZrLaO gate dielectric for large-area applications in the harsh radiation environment. In: 2021 International Conference on IC Design and Technology (ICICDT), 2021-9-15 - 2021-9-17.

This list was generated on Sat Sep 16 00:18:48 2023 BST.