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Benoit, M, Braccini, LS, Casanova, R, Cavallaro, E, Chen, HH, Chen, K, Di Bell, DFA, Ferrere, D, Frizzell, D, Golfing, T
et al (show 27 more authors) (2018) Test beam measurement of ams H35 HV-CMOS capacitively coupled pixel sensor prototypes with high-resistivity substrate. JOURNAL OF INSTRUMENTATION, 13 (12). P12009-P12009.

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