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Chai, Zheng, Zhang, Weidong, Freitas, Pedro, Hatem, Firas, Zhang, Jian Fu, Marsland, John, Govoreanu, Bogdan, Goux, Ludovic, Kar, Gouri Sankar, Hall, Steve 
ORCID: 0000-0001-8387-1036 et al (show 2 more authors)
(2018)
The Over-Reset Phenomenon in Ta<sub>2</sub>O<sub>5</sub> RRAM Device Investigated by the RTN-Based Defect Probing Technique.
IEEE ELECTRON DEVICE LETTERS, 39 (7).
pp. 955-958.